Session: 06-01 Micro/Nano Systems for Human Machine Interaction-Part 1

Paper Number: 109321

109321 - Alignment and Error Analysis to Improve Overlay Accuracy in Roll-to-Roll Screen Printing 

Products with printed electronics technology can be easily found around us. It is a technology used in various fields such as RFID (Radio frequency identification), flexible displays, and solar panels. Roll-to-roll process technology, which is one of printed electronic technologies, enables continuous production. In addition, it can produce printed electronic products at low cost and is suitable for high-speed and large-scale production. In recent research, roll-to-roll process technology is being applied to the production of TFT (Thin Film Transistor) used in OLED or the production of wearable sensors that can diagnose human health. Accordingly, next generation processes such as roll-to-roll nanoimprint and roll-to-roll lithography, which are capable of ultra-fine pattern printing, are attracting attention. Based on this, the roll-to-roll printing process is expected to continue to occupy an important part in the field of research on flexible devices in the fourth industrial revolution. Such products feature multi-layer structures rather than using a single pattern layer for printing. A product with excellent performance can be obtained only when overlay printing is performed well in a multi-layer structure. In addition, if the overlay accuracy is improved, the number of defective products can be reduced. In the roll-to-roll process, deformation of the film occurs due to tension when the film is winded or heat during the drying process of the ink. Therefore, to improve overlay accuracy, the effect of film deformation should be considered and compensated. In this paper, the deformation of the film is compensated by analyzing the register error after printing in the screen overlay printing process. To analyze the tendency of film deformation, register error is measured by dividing it into Machine Direction (MD) and Cross Direction (CD). The tendency of the film deformation is analyzed by measuring the error by comparing the reference register mark after printing and drying with the additionally overlay printed register mark. This process is repeated to analyze the average deformation of the film occurring in the screen printing process from the register error. The design of the screen mask changes to reflect the deformation of the film to perform overlaid printing that compensates for the deformation of the film. And it is verified that the overlay accuracy is improved through screen printing to which this compensation system is applied.

Presenting Author: Jongmo Kang Department of Mechanical Engineering, Chungnam National University

Presenting Author Biography: Jongmo Kang
Institution: Department of Mechanical Engineering, Chungnam National University